Texture and Stress: the forgotten X-ray Diffraction applications applied to materials
Keywords:
Materials Science, texture, stress, X-ray diffractionAbstract
X-ray crystallography result constitutes a fundamental analytical technique for the thorough study of the crystalline structure of materials. Despite to its enormous relevance at both scientific and industrial level, the popularization of its advanced analysis methodologies has been insufficient up today. Therefore, in this work we show different application possibilities using the X-ray diffraction, very useful in order to obtain in some cases critical information from our materials.
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Published
2020-09-14
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Copyright (c) 2020 Revista de Química

This work is licensed under a Creative Commons Attribution 4.0 International License.
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Texture and Stress: the forgotten X-ray Diffraction applications applied to materials. (2020). Revista de Química, 34(1-2), 15-21. https://revistas.pucp.edu.pe/index.php/quimica/article/view/22686










