Texture and Stress: the forgotten X-ray Diffraction applications applied to materials

Authors

Keywords:

Materials Science, texture, stress, X-ray diffraction

Abstract

X-ray crystallography result constitutes a fundamental analytical technique for the thorough study of the crystalline structure of materials. Despite to its enormous relevance at both scientific and industrial level, the popularization of its advanced analysis methodologies has been insufficient up today. Therefore, in this work we show different application possibilities using the X-ray diffraction, very useful in order to obtain in some cases critical information from our materials.

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Author Biography

  • Aitor Larrañaga Varga, SGIker, Universidad del País Vasco/Euskal Herriko Unibertsitatea (UPV/EHU)

    Aitor es Dr. en Ciencia de Materiales y es el responsable del servicio de difracción de rayos X en muestra policristalina del Servicio General de Investigación (SGIker) de la Universidad del País Vasco/Euskal Herriko Univertsitatea (UPV/EHU), en Leioa, España. Cuenta con más de 20 años de experiencia en difracción y ha publicado más de 100 artículos en revistas internacionales. 

    https://www.ehu.eus/es/web/sgiker/x-izpiak-molekulak-eta-materialak-kontaktua

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Published

2020-09-14

Issue

Section

Papers

How to Cite

Texture and Stress: the forgotten X-ray Diffraction applications applied to materials. (2020). Revista de Química, 34(1-2), 15-21. https://revistas.pucp.edu.pe/index.php/quimica/article/view/22686